个人简历

陈颖，博士毕业于清华大学精密仪器与机械学专业，现为北京航空航天大学可靠性与系统工程学院副教授，美国加州大学洛杉矶分校（UCLA）访问学者，主要从事故障物理、故障行为、电子产品可靠性仿真分析与设计等方面的研究。主讲本科生核心专业课“失效物理基础”和研究生核心课“电子产品可靠性与风险分析”。主持国家自然基金、技术基础、重大基础研究项目专题、航天基金等课题30余项。共发表论文80余篇，已授权发明专利40余项，出版《FMECA技术及其应用》、《故障物理学》、《电子产品可靠性分析与风险评估》等多部专著和教材，中航工业集团公司标准《Q/AVIC05061-2019 航空电子产品可靠性仿真试验方法》、《Q/AVIC05062-2019 航空产品故障模式机理及影响分析指南》的第一起草人。获省部级科技进步一等奖、省部级科技进步二等奖(排名1)、北京市科技奖、中国航空发动机集团科学技术奖、北航教学成果奖，北航优秀博士和优秀硕士生毕业论文指导教师。中国指挥与控制学会可靠性系统工程专委会委员，中国微米纳米协会高级会员，IEEE 、航空学会、中国电子学会会员。\r
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教育经历\r
2002.9 -- 2006.6 清华大学 精密仪器\r
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工作经历\r
2016.4 -- 2017.4 加州大学洛杉矶分校 访问学者\r
2008.3 -- 2014.7 北京航空航天大学 可靠性与系统工程学院 讲师\r
2014.8 -- 2021.7 北京航空航天大学 可靠性与系统工程学院 副教授 在职

研究领域

电子产品可靠性设计与评估综合解决方案（2020年-至今）\r
电子产品故障行为规则建模与自动推理仿真（2015年-至今）\r
故障物理学（2008年-至今）""

近期论文

电子产品可靠性设计与评估综合解决方案（2020年-至今）\r
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Ying Chen，Shumin Li, Rui Kang. Epistemic Uncertainty Quantification via Uncertainty Theory in the reliability evaluation of a system with Failure Trigger Effect. Reliability Engineering and System Safety 2021 (Q1 SCI，IF:7.247, WOS:000690283800080 )\r
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Ying Chen, Yanfang Wang, Shumin Li*, Rui kang. Hybrid uncertainty quantification of dependent competing failure process with chance theory. Reliability Engineering and System Safety 2021 (Q1 SCI，IF:7.247)\r
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Li YY, Chen Y, Zhang QY, Kang R. Belief reliability analysis of multi-state deteriorating systems under epistemic uncertainty[J]. Information Science, 2022(604):249-266 (Q1 SCI，IF:8.233,WOS:000807241000003)\r
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Yu Jia Wang, Rui kang. Ying Chen*. Belief reliability modeling for the two phase degradation system with a change point under small sample conditions.Computers & Industrial Engineering (Q1 SCI,IF:7.180）\r
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Shumin Li, Ying Chen. Reliably Evaluation Method Considering FM Dependency via Uncertainty Theory. 11th International Conference on Prognostics and System Health Management, PHM-Jinan October 2020 (EI：20210309780070)\r
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Qiaohui Chu, Ying Chen. Simulation Analysis and Belief Reliability Evaluation of Electromagnetic Performance of Electronic Product. Global Reliability and Prognostics and Health Management(PHM-Nanjing).2021 (EI：20220511542168) \r
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Xiao Hao, Chen Ying, Wang Yujia, Kang Rui. Belief Reliability Analysis of Electrical Performance Based on Analog Behavior Modeling. Global Reliability and Prognostics and Health Management(PHM-Nanjing).2021 (EI：20220511542319)\r
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电子产品故障行为规则建模与自动推理仿真（2015年-至今）\r
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Ying Chen, Liu Yang, Cui Ye Rui kang. Failure mechanism dependence and reliability evaluation of non-repairable system. Reliability Engineering and System Safety. 138 (2015) 273–283 ( Q1 SCI,IF:7.247,WOS:000352660900025)\r
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Ying Chen, Ying Yi Li, Kang R. Reliability analysis of PMS with failure mechanism accumulation rules and a hierarchical method. Reliability Engineering and System Safety. 2020, 197: 106774（Q1 SCI，IF:7.247,WOS:000527842500003）\r
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Ying Chen, Song Yang. Rui kang. Reliability evaluation of avionics system with imperfect fault coverage and propagated failure mechanisms Chinese Journal of Aeronautics. 2020. （Q1 SCI,IF:4.061, WOS:000616721000004）\r
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Ying Chen, Ze wang,qichao Ma Kun Liang, Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effect. IEEE/ASME Transactions on Mechatronics, 2019:24(6):2441-2452（Q1 SCI, IF:5.867,WOS:000506621800002）\r
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Ying Chen, Ze Wang, Rui Kang, Reliability Analysis of a Cold-Standby System Considering the Development Stages and Accumulations of Failure Mechanisms. Reliability Engineering and System Safety.2018,180:1-12（Q1 SCI,IF:7.247 WOS: 000447568900001）\r
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Li Y Y, Chen Y, Yuan ZX, Kang R. Reliability analysis of multi-state systems subject to failure mechanism dependence based on a combinational method. Reliability Engineering and System Safety. 2017, 166 109-123（Q1 SCI,IF:7.247,WOS:000405976600011）\r
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Ying Chen, Qichao Ma, Rui Kang. Reliability Evaluation of PMS Considering Coupling Effect of Functional and Physical Dependency. Chinese Journal of Aeronautics.2021 (Q1 SCI，IF:4.061, WOS:000793141700014 )\r
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Ying Chen Qichao Ma,Z Wang,Yingyi Li. reliability analysis of k-out-of-n system with load sharing and failure propagation effect Journal of System Engineering and Electronics. 20219(Q4 SCI，IF:1.363,WOS：000715663300020)\r
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Ying Chen Yanfang Wang, Song Yang, Rui Kang. System reliability evaluation method considering physical dependency with FMT and BDD analytical algorithm. Journal of System Engineering and Electronics.2021( Q4 SCI，IF: 1.363, WOS：000764824700022) \r
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Ying Chen, Ying Yi Li, Rui Kang. Reliability Analysis of MS-PM Systems Based on Failure Mechanism Accumulation Method. 2018,6: 45707-45714. IEEE ACCESS. 10.1109/ACCESS.2018.2865239（SCI,IF:3.476 WOS:000445112900001）\r
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Ying Chen, Xiaoyong Yu, Ying Yi Li. A Failure Mechanism Cumulative Model for Reliability Evaluation of k-out-of-n system with load sharing effect. IEEE ACESS （SCI,IF:3.476 WOS:000455697100001）\r
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Ying Chen, Song Yang, Weiyangmen. Automatic Generation of Failure Mechanism Propagation Scenario via Guided Simulation and Intelligent Algorithm. IEEE ACESS（SCI,IF:3.476 WOS: 000463442500001）\r
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Jiayue Fang, Rui Kang, Ying Chen* Reliability evaluation of non-repairable systems with failure mechanism trigger effect?. Reliability Engineering and System Safety. 210(2021)107454（Q1 SCI，IF:7.247, WOS:000663909400004）\r
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Yu Jia Wang, Rui kang. Ying Chen*. Assessment of Engine Electronic Controllers Based on Bayesian Deep Learning and Cloud Computing. Chinese Journal of Aeronautics. 2020. （Q1 SCI,IF:4.061, WOS：000631866800006）\r
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Ying Chen, Ze Wang, Failure Behavior of Multi-State System Considering Functional and Physical Isolation Effects. Proceedings of the Institution of Mechanical Engineers Part O-Journal of Risk and Reliability (Q3,2.021,WOS:000690416100001)\r
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Ying Chen, Ze Wang, Rui Kang. Failure Behavior Analysis of Phased-Mission Systems Considering Functional and Physical Isolation Effects, Chinese Journal of Aeronautics. （Q1 SCI，IF:4.061）\r
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Ying Chen, Tianyu Yang, and Yan Fang Wang. Reliability modeling of mutual DCFP considering failure physical dependency. Journal of System Engineering and Electronics.2022( Q4 SCI，IF: 1.363) \r
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Fan, M., Zeng, Z., Zio E., Kang, R. and Chen Y. A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes IEEE Transactions on Reliability, 2019. 68( 1) : 317-329 (Q1 SCI, IF: 5.833, WOS: 000460728600021)\r
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Fan, M., Zeng, Z., Zio E., Kang, R. and Chen Y. A stochastic hybrid systems model of common-cause failures of degrading components. Reliability Engineering & System Safety, 2018. 172: p. 159-170. ( Q1 SCI,IF:7.242,WOS: 000424960000015)\r
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Fan, M., Zeng, Z., Zio E., Kang, R. and Chen Y., A stochastic hybrid systems based framework for modeling dependent failure processes. PLOS ONE, 2017. 12(2) e0172680. (Q2 SCI, IF: 3.752 ,WOS: 000394682400069)\r
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故障物理学（2008年-至今）\r
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Ying Chen, WeiYang Men, Zenghui Yuan, Rui Kang, Ali Mosleh. Nonlinear Damage Accumulation Rule for Solder Life Prediction under Combined Temperature profile with Varying Amplitude. IEEE Transactions on Components Packaging and manufacturing Technology. （Q3，SCI，IF:1.922, WOS:000456669500005）\r
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Ying Chen，Ning Tang, ZX Yuan Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition based on CPSD of MPI. Shock and Vibration Vol. 20,2016,1-11（Q3 SCI，IF:1.616WOS:000389467100001) \r
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Ying Chen，Cui Ye ，Rui Kang. Optimal Design of Piezoelectric Vibration device with Constrained Variable Algorithm and FEA method. Journal of Vibroengineering,2014, 16(6): 2962-2968 (SCI,IF:0.398,WOS:000342905300031)\r
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Ying Chen, Bingdong Liu, Rui Kang. Study of vibratory stress relief effect of quartz flexible accelerometer with FEA method. Journal of Vibroengineering, 2013,15(2):784-793(SC,IF:0.398,WOS:000320714500026)\r
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骆明珠，陈 颖，康 锐.基于 PoF 模型的电子产品可靠性参数计算方法. 系统工程与电子技术.2014 ，36(4):795-801 (EI:20142117744572).\r
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陈颖，高蕾，康锐. 基于故障物理的电子产品可靠性仿真分析方法. 中国电子科学研究院学报.2013,8(5):444-448 \r
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陈颖,侯泽兵,康锐.故障模式、机理及影响分析(FMMEA)及应用研究.中国航空学会12届学术年会.2010年10月\r
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陈颖,康锐. 球栅阵列封装焊点寿命预测的综合方法.焊接学报.2009,30(11): 105-108（EI：20095312588198）\r
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陈颖,霍玉杰,谢劲松,张源. 印刷线路板设计参数对镀通孔可靠性的影响. 北京航空航天大学学报.2007，33(8):954-958 (EI：074110859440)\r
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陈颖, 康锐. PBGA封装焊点寿命影响因素的有限元分析.半导体技术.2008,33(7):563-566(核心期刊)\r
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陈颖,谢劲松,孔令文. 镀通孔制造过程的失效机理与物理模型.电子元件与材料.2007,26(6):4-7(核心期刊)\r
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陈颖,孙博,谢劲松,李健.芯片粘接空洞对功率器件散热特性的影响.半导体技术，2007,32(10):859-862(核心期刊)
IEEE可靠性协会会员 中国故障预测与健康管理学会会员